Electronics, Vol. 12, Pages 1662: AMFF-YOLOX: Towards an Attention Mechanism and Multiple Feature Fusion Based on YOLOX for Industrial Defect Detection

Electronics, Vol. 12, Pages 1662: AMFF-YOLOX: Towards an Attention Mechanism and Multiple Feature Fusion Based on YOLOX for Industrial Defect Detection

Electronics doi: 10.3390/electronics12071662

Authors: Yu Chen Yongwei Tang Huijuan Hao Jun Zhou Huimiao Yuan Yu Zhang Yuanyuan Zhao

Industrial defect detection has great significance in product quality improvement, and deep learning methods are now the dominant approach. However, the volume of industrial products is enormous and mainstream detectors are unable to maintain a high accuracy rate during rapid detection. To address the above issues, this paper proposes AMFF-YOLOX, an improved industrial defect detector based on YOLOX. The proposed method can reduce the activation function and normalization operation of the bottleneck in the backbone network, and add an attention mechanism and adaptive spatial feature fusion within the feature extraction network to enable the network to better focus on the object. Ultimately, the accuracy of the prediction is enhanced without excessive loss of speed in network prediction, with competitive performance compared to mainstream detectors. Experiments show that the proposed method in this paper achieves 61.06% (85.00%) mAP@0.5:0.95 (mAP@0.5) in the NRSD-MN dataset, 51.58% (91.09%) is achieved in the PCB dataset, and 49.08% (80.48%) is achieved in the NEU-DET dataset. A large number of comparison and ablation experiments validate the effectiveness and competitiveness of the model in industrial defect detection scenarios.